Title :
Redefining ATE: "data collection engines that drive yield learning and process optimization"
Author_Institution :
IBM Technol. & Syst. Group, Essex Junction, VT, USA
Abstract :
A top priority for IC producers is achieving high yields - particularly early in the product lifetime. "Yield learning rate" (on real products) is the key differentiator among IC suppliers. Testing must play a larger role in driving yield learning - which change the testing methods, ATE requirements and how the IC business views the value of testing.
Keywords :
automatic test equipment; circuit optimisation; integrated circuit testing; integrated circuit yield; ATE requirements; IC producers; IC suppliers; data collection engines; process optimization; product lifetime; yield learning rate; Automatic testing; Cause effect analysis; Circuit testing; Costs; Data analysis; Engines; Failure analysis; Integrated circuit testing; Life testing; Manufacturing;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1387437
