Title :
Loopback or not? (loopback testing)
Author :
Yamaguchi, Takahiro J.
Author_Institution :
Advantest Lab. Ltd., Miyagi, Japan
Abstract :
For the verification of high-speed serial I/O devices, a new architecture, which is different from the conventional ET sampling method, must be developed to measure ultra-wideband jitter in the bit stream transmitted from a multi-Gb/s physical layer IC. For testing in a high-volume test environment, our challenge is to find a way to test the jitter tolerance of Rx that is more effective than the conventional loopback test.
Keywords :
integrated circuit testing; sampling methods; timing jitter; equivalent time sampling method; high speed serial I/O devices; jitter measurement; jitter tolerance testing; loopback testing; multi-Gb/s physical layer IC; ultra wideband jitter;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1387442
