DocumentCode :
2451186
Title :
Di-interstitial diffusivity and migration path calculations based on tight-binding Hamiltonian molecular dynamics
Author :
Hane, Masami ; Ikezawa, Takeo ; Gilmer, George H.
Author_Institution :
Silicon Syst. Res. Labs., NEC Corp., Sagamihara, Japan
fYear :
2000
fDate :
2000
Firstpage :
119
Lastpage :
122
Abstract :
Molecular dynamics calculations were performed for di-interstitial-silicon based on the tight-binding model for silicon. Calculation results indicate that the di-interstitial can diffuse into crystalline silicon as fast as the mono-interstitial silicon. Three kinds of the stable configurations were found: T, Z, and W-configuration. The T-configuration is the lowest while the W is the higher energy level configuration. A critical-path method (a saddle-point search algorithm) revealed the di-interstitial migration pathway. The T to W transition needs about 0.96 eV of the barrier energy, and the W to W transition can occur for less than 0.1 eV barrier energy. Therefore, di-interstitials can show a long-range hop via the W-W transition which should be thermally initiated by the T-W transition (reorientation)
Keywords :
critical path analysis; diffusion; elemental semiconductors; interstitials; molecular dynamics method; silicon; tight-binding calculations; T to W transition; T-W transition reorientation; T-configuration; W to W transition; W-configuration; Z-configuration; barrier energy; configuration energy level; critical-path method; crystalline silicon; di-interstitial diffusion; di-interstitial diffusivity; di-interstitial long-range hop; di-interstitial migration pathway; di-interstitial-silicon; migration path calculations; molecular dynamics calculations; mono-interstitial silicon; saddle-point search algorithm; silicon; stable configurations; thermally initiated W-W transition; tight-binding Hamiltonian molecular dynamics; tight-binding model; Annealing; Computational modeling; Crystallization; Energy states; Geometry; Laboratories; Laser transitions; Linear discriminant analysis; National electric code; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2000. SISPAD 2000. 2000 International Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-6279-9
Type :
conf
DOI :
10.1109/SISPAD.2000.871222
Filename :
871222
Link To Document :
بازگشت