DocumentCode
2451500
Title
Self test system for integrated hall effect sensors
Author
Ionescu, Mihai-Alexandru ; Bodner, Christof ; Dineci, Stefan ; Brezeanu, Gheorghe
Author_Institution
Politeh. Univ. of Bucharest, Bucharest, Romania
Volume
2
fYear
2009
fDate
12-14 Oct. 2009
Firstpage
533
Lastpage
536
Abstract
This paper presents a new way to test integrated Hall effect sensors, by converting the internal measured parameters into other parameters, which can be measured more easily, with less complex equipment and in a shorter time. A comparison between SPICE, and Simulink simulations and with an analytical model is achieved, in order to evaluate the precision of the method.
Keywords
Hall effect devices; SPICE; amplifiers; automatic testing; circuit testing; comparators (circuits); delays; low-pass filters; magnetic sensors; SPICE simulation; Simulink simulation; amplifier; analytical model; comparator; digital delay; integrated Hall effect sensors; low pass filter; self test system; Automatic testing; Circuit testing; Equations; Hall effect devices; Low pass filters; Magnetic hysteresis; Magnetic sensors; Mechanical sensors; Sensor systems; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2009. CAS 2009. International
Conference_Location
Sinaia
ISSN
1545-827X
Print_ISBN
978-1-4244-4413-7
Type
conf
DOI
10.1109/SMICND.2009.5336656
Filename
5336656
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