• DocumentCode
    2451668
  • Title

    On the Adequacy of Statecharts as a Source of Tests for Cryptographic Protocols

  • Author

    Jayaram, K.R. ; Mathur, Aditya P.

  • Author_Institution
    Dept. of Comput. Sci., Purdue Univ., West Lafayette, IN
  • fYear
    2008
  • fDate
    July 28 2008-Aug. 1 2008
  • Firstpage
    937
  • Lastpage
    942
  • Abstract
    The effectiveness of statecharts as a tool to express the desired behavior of security protocols and a source of tests for their implementations was investigated. Specifically, TLS protocol was modeled as a statechart and tests generated from its flattened version. The GnuTLS implementation of the protocol was then tested against the generated tests. The MC/DC coverage of different components of the implementation varied from 51% to 81%. A "what if" analysis revealed that while some defects in the uncovered code will not lead to any security vulnerability due to in-built fault tolerance, others might lead to improper authentication, integrity failure, session hijacking, denial of service, and loss of confidentiality. The analysis suggests that statecharts alone might not be an adequate tool as a source of tests for implementations of security protocols and that tests so generated must be augmented through other formal means such as random testing, stress testing, and code coverage analysis.
  • Keywords
    cryptographic protocols; program testing; GnuTLS implementation; MC-DC coverage; code coverage analysis; cryptographic protocols; denial of service; integrity failure; random testing; security vulnerability; session hijacking; statechart; stress testing; Access protocols; Computer applications; Computer errors; Cryptographic protocols; DC generators; Data security; Failure analysis; Information security; Software testing; Software tools; MC/DC coverage; Security Vulnerability; Security protocol; Statechart; TLS protocol;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications, 2008. COMPSAC '08. 32nd Annual IEEE International
  • Conference_Location
    Turku
  • ISSN
    0730-3157
  • Print_ISBN
    978-0-7695-3262-2
  • Electronic_ISBN
    0730-3157
  • Type

    conf

  • DOI
    10.1109/COMPSAC.2008.203
  • Filename
    4591698