DocumentCode
2451940
Title
Guidelines for the power constrained design of a CMOS tuned LNA
Author
Goo, Jung-Suk ; Oh, Kwang-Hoon ; Choi, Chang-Hoon ; Yu, Zhiping ; Lee, Thomas H. ; Dutton, Robert W.
Author_Institution
Center for Integrated Syst., Stanford Univ., CA, USA
fYear
2000
fDate
2000
Firstpage
269
Lastpage
272
Abstract
The first stage of a receiver is typically an LNA (low noise amplifier) which must provide sufficient gain while introducing as little noise as possible. Recently proposed noise optimization techniques for CMOS RF circuits permit greater flexibility in selection of device geometries as well as matching elements and biasing conditions to minimize the noise figure for a specified gain or power dissipation (Shaeffer and Lee, 1997). Nevertheless, such approaches still have ambiguity because intrinsic noise is assumed to be bias-independent. To utilize the new degrees of freedom in noise figure optimization, more complete intrinsic noise information on MOSFETs across the entire bias range is needed. A recent study has reported extensive experimental noise results of the 0.75 μm SOI MOSFET technology (Dambrine et al, 1999) but provided limited guidance for actual LNA design. A physical noise simulator has been developed using two-dimensional device simulation; successful noise simulation results have been reported for MOSFETs with channel lengths down to 0.25 μm for the first time (Goo et al, Proc. Symp. VLSI Tech., p. 153, 1999). Based on intrinsic high frequency noise simulation results, this paper presents explicit design guidelines for a CMOS tuned LNA with power constraints
Keywords
CMOS analogue integrated circuits; MOSFET; circuit optimisation; circuit simulation; circuit tuning; integrated circuit design; integrated circuit modelling; integrated circuit noise; radiofrequency amplifiers; 2D device simulation; CMOS RF circuit flexibility; CMOS RF circuits; CMOS tuned LNA; LNA; LNA design; LNA gain; MOSFET channel length; MOSFETs; SOI MOSFET technology; SiO2-Si; bias range; biasing conditions; design guideline; device geometries; intrinsic high frequency noise simulation; intrinsic noise; low noise amplifier; matching elements; noise; noise figure minimization; noise figure optimization; noise optimization techniques; noise simulation; physical noise simulator; power constrained design guidelines; power constraints; power dissipation; receiver stage; CMOS technology; Circuit noise; Flexible printed circuits; Geometry; Guidelines; Low-noise amplifiers; MOSFETs; Noise figure; Radio frequency; Radiofrequency amplifiers;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices, 2000. SISPAD 2000. 2000 International Conference on
Conference_Location
Seattle, WA
Print_ISBN
0-7803-6279-9
Type
conf
DOI
10.1109/SISPAD.2000.871260
Filename
871260
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