DocumentCode :
245199
Title :
Automatic mura inspection using the principal component analysis for the TFT-LCD panel
Author :
Jim-Woo Yun ; Heon Gu ; Kim, Dae-hwan ; Hoi-Sik Moon ; Sung-Jea Ko
Author_Institution :
Sch. of Electr. Eng., Korea Univ., Seoul, South Korea
fYear :
2014
fDate :
26-28 May 2014
Firstpage :
109
Lastpage :
110
Abstract :
In this paper, we propose a principal component analysis (PCA)-based mura detection algorithm. Recent conventional algorithms divide the panel image with the detection window and detect the mura in each detection window. However, these algorithms have several problems due to the limitation of the detection window size. To overcome these problems, we first estimate the background image of the entire panel image by applying the PCA method. And then, the difference image between the input panel image and the estimated background image is used for the mura region decision. The experimental results show that the proposed algorithm outperforms the conventional mura detection algorithm.
Keywords :
automatic testing; liquid crystal displays; principal component analysis; thin film transistors; TFT-LCD panel; automatic mura inspection; background image; detection window size; estimated background image; input panel image; mura region decision; principal component analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Consumer Electronics - Taiwan (ICCE-TW), 2014 IEEE International Conference on
Conference_Location :
Taipei
Type :
conf
DOI :
10.1109/ICCE-TW.2014.6904008
Filename :
6904008
Link To Document :
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