DocumentCode :
2452357
Title :
Amplifier noise measurements at NIST
Author :
Wait, D.F.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
1996
fDate :
17-21 June 1996
Firstpage :
370
Lastpage :
371
Abstract :
The National Institute of Standards and Technology (NIST) has certified noise figure measurements near 0.6 dB with an uncertainty of /spl plusmn/0.05 dB. This paper addresses the error analysis and measurement assurance used for these measurements.
Keywords :
amplifiers; circuit noise; electric noise measurement; error analysis; measurement errors; 0.6 dB; NIST; National Institute of Standards and Technology; amplifier noise measurements; error analysis; measurement assurance; noise figure measurements; uncertainty; Acoustic reflection; Background noise; Connectors; Cryogenics; NIST; Noise figure; Noise measurement; Radiometry; Scattering parameters; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
Type :
conf
DOI :
10.1109/CPEM.1996.547119
Filename :
547119
Link To Document :
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