Title :
The multi-state radiometer: a novel means for impedance and noise temperature measurement
Author :
Wiatr, W. ; Schmidt-Szalowski, M.
Author_Institution :
Inst. of Electron. Fundamentals, Warsaw Univ. of Technol., Poland
Abstract :
A unique noise measurement system for simultaneous determination of the impedance and noise temperature of microwave one-ports is presented. It employs a multi-state total-power radiometer, and techniques of calibration and error correction. Good measurement accuracy has been achieved using a high precision radiometer fitted with a noise injecting circuit to excite the DUT.
Keywords :
calibration; electric impedance measurement; electric noise measurement; error correction; measurement errors; microwave measurement; radiometers; radiometry; semiconductor device testing; calibration; de-embedding device parameters; error correction; high precision radiometer; impedance measurement; measurement accuracy; microwave one-ports; multi-state radiometer; multi-state total-power radiometer; noise injecting circuit; noise temperature measurement; semiconductor device; Acoustic reflection; Bridge circuits; Circuit noise; Impedance; Instruments; Microwave radiometry; Microwave technology; Noise measurement; Semiconductor device noise; Temperature measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.547120
