Title :
Defect inspection of disposable glucose test strips using machine vision
Author :
Hsu-Nan Yen ; Wei Chen Lee
Author_Institution :
Dept. of Electron. Eng., St. John´s Univ., New Taipei, Taiwan
Abstract :
This paper presents a machine vision system for defect inspection disposable glucose test strips. The proposed system first lightened and captured image of flawless glucose test strip while offline training. The captured image was processed through image processing technology to establish standard projection data of silver paste and carbon rubber in flawless glucose test strips. Then the measured blood glucose test strips were processed with the same lighting and image processing procedures when online detection. The defects of the measured blood glucose test strips were inspected by the projection data comparison. Experiments show that the proposed system can effectively detect three main defects on glucose test strips, i.e., silver exposing, short circuit of carbon paste electrode and unglued carbon plastic electrode.
Keywords :
automatic optical inspection; computer vision; electrodes; image capture; strips; sugar; blood glucose test strip measurement; captured image processing; carbon paste electrode; carbon rubber; disposable glucose test strip defect inspection; image lightening; machine vision system; offline training; online detection; short-circuits; silver exposure; silver paste; standard projection data; unglued carbon plastic electrode; Blood; Carbon; Electrodes; Inspection; Silver; Strips; Sugar;
Conference_Titel :
Consumer Electronics - Taiwan (ICCE-TW), 2014 IEEE International Conference on
Conference_Location :
Taipei
DOI :
10.1109/ICCE-TW.2014.6904022