Title :
Thin polyimide films for dielectric interlayer application
Author :
Damaceanu, Mariana-Dana ; Rusu, Radu-Dan ; BRUMA, Maria ; Müller, Alexandru
Author_Institution :
Petru Poni Inst. of Macromolecular Chem., Iasi, Romania
Abstract :
Thin films based on siloxane-containing polyimides have been prepared by the drop-casting technique. These films with thickness of tens of micrometers were flexible and resisted to repeated bendings. Very thin films having the thickness in the nanometer range, with neat surface, without pinholes or cracks, were obtained, as well. The mechanical and dielectric properties of these polyimide films were measured and discussed.
Keywords :
casting; dielectric losses; dielectric thin films; elastic constants; elastic moduli; electric breakdown; elongation; permittivity; polymer films; tensile testing; breakdown voltage; dielectric constant; dielectric interlayer application; dielectric loss; dielectric properties; drop-casting technique; elastic modulus; elongation; mechanical properties; stiffness; tensile strength; tensile testing; thin polyimide films; Dielectric constant; Dielectric films; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric thin films; Frequency; Polyimides; Temperature;
Conference_Titel :
Semiconductor Conference, 2009. CAS 2009. International
Conference_Location :
Sinaia
Print_ISBN :
978-1-4244-4413-7
DOI :
10.1109/SMICND.2009.5336709