DocumentCode :
2452650
Title :
Frequency Dependence of the Interaction Between SAW and Ni Films
Author :
Yoshida, Hajime ; Levy, Moises ; McAvoy, Bruce ; Salvo, Harry, Jr.
fYear :
1982
fDate :
27-29 Oct. 1982
Firstpage :
1036
Lastpage :
1039
Keywords :
Attenuation; Frequency dependence; Insertion loss; Loss measurement; Magnetic field induced strain; Magnetic field measurement; Magnetic films; Nickel; Substrates; Surface acoustic waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1982 Ultrasonics Symposium
Conference_Location :
San Diego, CA, USA
Type :
conf
DOI :
10.1109/ULTSYM.1982.197990
Filename :
1534930
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2452650
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