• DocumentCode
    2452650
  • Title

    Frequency Dependence of the Interaction Between SAW and Ni Films

  • Author

    Yoshida, Hajime ; Levy, Moises ; McAvoy, Bruce ; Salvo, Harry, Jr.

  • fYear
    1982
  • fDate
    27-29 Oct. 1982
  • Firstpage
    1036
  • Lastpage
    1039
  • Keywords
    Attenuation; Frequency dependence; Insertion loss; Loss measurement; Magnetic field induced strain; Magnetic field measurement; Magnetic films; Nickel; Substrates; Surface acoustic waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    1982 Ultrasonics Symposium
  • Conference_Location
    San Diego, CA, USA
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1982.197990
  • Filename
    1534930
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2452650