DocumentCode :
2452776
Title :
Effect Of Product Lines On Current Process Technology
Author :
Huff, Karen E.
Author_Institution :
GTE Laboratories Incorporated, Waltham, MA
fYear :
1996
fDate :
17-19 June 1996
Firstpage :
5
Lastpage :
7
Keywords :
Added delay; Costs; Delay effects; Independent component analysis; Knowledge management; Laboratories; Neck; Process control; Project management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Process Workshop, 1996. Process Support of Software Product Lines., Proceedings of the 10th International
Conference_Location :
Dijon, France
Print_ISBN :
0-8186-7725-2
Type :
conf
DOI :
10.1109/ISPW.1996.654355
Filename :
654355
Link To Document :
بازگشت