DocumentCode

2452776

Title

Effect Of Product Lines On Current Process Technology

Author

Huff, Karen E.

Author_Institution

GTE Laboratories Incorporated, Waltham, MA

fYear

1996

fDate

17-19 June 1996

Firstpage

5

Lastpage

7

Keywords

Added delay; Costs; Delay effects; Independent component analysis; Knowledge management; Laboratories; Neck; Process control; Project management;

fLanguage

English

Publisher

ieee

Conference_Titel

Software Process Workshop, 1996. Process Support of Software Product Lines., Proceedings of the 10th International

Conference_Location

Dijon, France

Print_ISBN

0-8186-7725-2

Type

conf

DOI

10.1109/ISPW.1996.654355

Filename

654355