DocumentCode :
2452973
Title :
Multiple fault diagnosis with BDD based boolean differential equations
Author :
Ubar, Raimund ; Raik, Jaan ; Kostin, Sergei ; Kõusaar, Jaak
Author_Institution :
TTU, Tallinn, Estonia
fYear :
2012
fDate :
3-5 Oct. 2012
Firstpage :
77
Lastpage :
80
Abstract :
We present a new idea for multiple fault diagnosis in combinational circuits, which combines the concept of multiple fault testing by test groups and solving Boolean differential equations by manipulation of Binary Decision Diagrams (BDDs). A novel 5-valued algebra is introduced for simplifying differential equations, and a discussion is presented how this approach can be used as a basis for hierarchical fault diagnosis to cope with the complexity problem.
Keywords :
Boolean algebra; binary decision diagrams; circuit testing; combinational circuits; differential equations; fault diagnosis; 5-valued algebra; BDD; Boolean differential equation; binary decision diagram manipulation; combinational circuit; complexity problem; multiple fault diagnosis; multiple fault testing; Boolean functions; Circuit faults; Data structures; Differential equations; Fault diagnosis; Integrated circuit modeling; Mathematical model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Conference (BEC), 2012 13th Biennial Baltic
Conference_Location :
Tallinn
ISSN :
1736-3705
Print_ISBN :
978-1-4673-2775-6
Type :
conf
DOI :
10.1109/BEC.2012.6376819
Filename :
6376819
Link To Document :
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