• DocumentCode
    2453340
  • Title

    A new converter protection scheme for doubly-fed induction generators during disturbances

  • Author

    Yang, Jin ; Dorrell, David G. ; Fletcher, John E.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Glasgow, Glasgow, UK
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    2100
  • Lastpage
    2105
  • Abstract
    Fault ride-through capability is one of the basic requirements for a large-scale wind farm. There are two aspects to fault ride-through: to continue power supply without breaking any part of the system and to resume normal operation after clearance of the fault. In this paper the transients of the doubly-fed induction generator is analyzed. The safe operating area characteristics of the IGBT converter are also considered. After this, the use of a high-power resistor as a traditional crowbar, DC-link braking resistor and a series dynamic resistor are discussed. From the discussion, a new protection control scheme, with a crowbar and a series dynamic resistor, is proposed. The new scheme is shown to reduce the rotor high current, maximize the working time of DFIG control then reduce the power, speed and torque fluctuations and protect it during disturbances. The method is verified using PSCAD/EMTDC simulations.
  • Keywords
    insulated gate bipolar transistors; power convertors; power system faults; power system protection; wind power plants; DC link braking resistor; IGBT converter; converter protection scheme; doubly fed induction generators; fault ride; high power resistor; large scale wind farm; protection control scheme; series dynamic resistor; Induction generators; Insulated gate bipolar transistors; Large-scale systems; Power supplies; Power system protection; Power system stability; Resistors; Resumes; Transient analysis; Wind farms; DFIG; Doubly-fed induction generator; converter protection; fault ride-through; wind power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758281
  • Filename
    4758281