DocumentCode :
2453611
Title :
Integrated Design/validation Methodology For Fault Tolerant (dependable) Computing Systems
Author :
Bettencourt, Chip
Author_Institution :
Raytheon Company
fYear :
1994
fDate :
25-26 Apr 1994
Firstpage :
10
Lastpage :
12
Keywords :
Application specific integrated circuits; Circuit faults; Circuit testing; Design methodology; Emulation; Fault detection; Fault tolerant systems; Hardware; Logic testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrating Error Models with Fault Injection, 1994., Third Int'l Workshop on
Type :
conf
DOI :
10.1109/WIEM.1994.654392
Filename :
654392
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2453611
