• DocumentCode
    2453618
  • Title

    Photovoltaic module diagnostics by series resistance monitoring and temperature and rated power estimation

  • Author

    Sera, Dezso ; Teodorescu, Remus ; Rodriguez, Pedro

  • Author_Institution
    Inst. of Energy Technol., Aalborg Univ., Aalborg
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    2195
  • Lastpage
    2199
  • Abstract
    One of the most important parameters, which characterizes a photovoltaic panel health state, is its series resistance. An increase of this, normally indicates bad contacts between cells or panels. An other important property, which characterizes the aging of the panel is the reduction of its MPP power in standard test conditions (STC1). Simulation and experimental measurements regarding the determination of a PV panel series resistance, its MPP power in STC, as well as its temperature, are presented in this paper. It is shown that the panel series resistance can be determined experimentally without needing to perform an entire I-V curve scan. The panel MPP power in STC and its temperature - given the irradiance is measured - can be well approximated using the measured I-V curve, and a simple model of the PV panel.
  • Keywords
    ageing; invertors; photovoltaic power systems; power system measurement; power system state estimation; PV inverters; panel series resistance; photovoltaic module diagnostics; photovoltaic panel health state; power point tracking; rated power estimation; series resistance monitoring; standard test conditions; temperature power estimation; Aging; Electric resistance; Electrical resistance measurement; Equations; Photovoltaic systems; Power measurement; Solar power generation; Temperature measurement; Temperature sensors; Testing; Photovoltaic; STC power estimation; diagnostics; modeling; series resistance measurement; temperature estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758297
  • Filename
    4758297