DocumentCode
2453618
Title
Photovoltaic module diagnostics by series resistance monitoring and temperature and rated power estimation
Author
Sera, Dezso ; Teodorescu, Remus ; Rodriguez, Pedro
Author_Institution
Inst. of Energy Technol., Aalborg Univ., Aalborg
fYear
2008
fDate
10-13 Nov. 2008
Firstpage
2195
Lastpage
2199
Abstract
One of the most important parameters, which characterizes a photovoltaic panel health state, is its series resistance. An increase of this, normally indicates bad contacts between cells or panels. An other important property, which characterizes the aging of the panel is the reduction of its MPP power in standard test conditions (STC1). Simulation and experimental measurements regarding the determination of a PV panel series resistance, its MPP power in STC, as well as its temperature, are presented in this paper. It is shown that the panel series resistance can be determined experimentally without needing to perform an entire I-V curve scan. The panel MPP power in STC and its temperature - given the irradiance is measured - can be well approximated using the measured I-V curve, and a simple model of the PV panel.
Keywords
ageing; invertors; photovoltaic power systems; power system measurement; power system state estimation; PV inverters; panel series resistance; photovoltaic module diagnostics; photovoltaic panel health state; power point tracking; rated power estimation; series resistance monitoring; standard test conditions; temperature power estimation; Aging; Electric resistance; Electrical resistance measurement; Equations; Photovoltaic systems; Power measurement; Solar power generation; Temperature measurement; Temperature sensors; Testing; Photovoltaic; STC power estimation; diagnostics; modeling; series resistance measurement; temperature estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location
Orlando, FL
ISSN
1553-572X
Print_ISBN
978-1-4244-1767-4
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2008.4758297
Filename
4758297
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