Title :
Verification Of Error Models Through Low-level Simulation
Author :
Tsai, T.K. ; Choi, G.S. ; Iyer, R.K.
Author_Institution :
Univ. of Illinois, Urbana, IL 61801
Keywords :
Aerospace electronics; Aircraft; Circuit faults; Circuit simulation; Computational modeling; Dictionaries; Error correction; Error probability; Microprocessors; Registers;
Conference_Titel :
Integrating Error Models with Fault Injection, 1994., Third Int'l Workshop on
DOI :
10.1109/WIEM.1994.654394
