Title :
Learning sparse representation for leaf image recognition
Author :
Jou-Ken Hsiao ; Li-Wei Kang ; Ching-Long Chang ; Chao-Yung Hsu ; Chia-Yen Chen
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Yunlin Univ. of Sci. & Technol., Touliu, Taiwan
Abstract :
Automatic plant identification via computer vision techniques has been greatly important for a number of professionals, such as environmental protectors, land managers, and foresters. In this paper, a novel leaf image recognition technique via sparse representation is proposed for automatic plant identification. In order to model leaf images, we learn an overcomplete dictionary for sparsely representing the training images of each leaf species. Each dictionary is learned using a set of descriptors extracted from the training images in such a way that each descriptor is represented by linear combination of a small number of dictionary atoms. For each test leaf image, we calculate the correlation between the image and each learned dictionary of leaf species to achieve the identification of the leaf image. As a result, efficient leaf recognition can be achieved on public leaf dataset based on the proposed framework leading to a more compact and richer representation of leaf images compared to traditional clustering approaches. Moreover, our method is also adapted to newly added leaf species without retraining classifiers and suitable to be highly parallelized as well as integrated with any leaf image descriptors/features.
Keywords :
feature extraction; image recognition; image representation; learning (artificial intelligence); automatic plant identification; computer vision technique; leaf dataset; leaf image descriptor extraction; leaf image feature extraction; leaf image identification; leaf image recognition; linear combination; overcomplete dictionary learning; sparse representation; Computer vision; Dictionaries; Educational institutions; Feature extraction; Image recognition; Shape; Training;
Conference_Titel :
Consumer Electronics - Taiwan (ICCE-TW), 2014 IEEE International Conference on
Conference_Location :
Taipei
DOI :
10.1109/ICCE-TW.2014.6904061