Title :
Evaluation Of Very High Coverage
Author :
Powell, David ; Arlat, Jean
Author_Institution :
LA AS-CNRS 7, Avenue du Colonel Roche 31400 Toulouse, France
Keywords :
Fault tolerance; Gaussian distribution; Impedance; Probes; Sampling methods; State estimation; State-space methods; Statistical distributions;
Conference_Titel :
Integrating Error Models with Fault Injection, 1994., Third Int'l Workshop on
DOI :
10.1109/WIEM.1994.654399
