• DocumentCode
    2453875
  • Title

    An application of interleaved DC-DC converters to obtain I-V characteristic curves of photovoltaic modules

  • Author

    Durán, E. ; Galán, J. ; Sidrach-de-Cardona, M. ; Segura, F.

  • Author_Institution
    Dipt. de Ing. Electron., de Sist. Informaticos y Autom., Univ. of Huelva, Huelva
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    2284
  • Lastpage
    2289
  • Abstract
    The basic operation of a solar cell, module or photovoltaic generator under different irradiation and temperature conditions is characterized by its I-V characteristic curve. Only the experimental measurement of the I-V curve allows us to know the electrical parameters of a photovoltaic cell, module or array. This measure provides very relevant information for the design, installation and maintenance of photovoltaic systems. Currently, the I-V characteristic curve is obtained by connecting a variable charge to the panel terminals in order to achieve that the current of the terminals ranges from zero to the short circuit current. In this paper, a new experimental methodology to measure this characteristic curve by using several SEPIC converters in parallel connection operating in interleaved mode is proposed. This methodology provides two fundamental advantages for this application as regards the use of a single converter: (1) It allows to reproduce I-V curves of higher power (2) It allows to obtain these curves with lower ripple.
  • Keywords
    DC-DC power convertors; photovoltaic power systems; short-circuit currents; solar cells; I-V characteristic curves; SEPIC converters; electrical parameters; interleaved DC-DC converters; photovoltaic generator; photovoltaic modules; short circuit current; solar cell; DC-DC power converters; Electric variables measurement; Joining processes; Photovoltaic cells; Photovoltaic systems; Pollution measurement; Power generation; Solar power generation; Temperature dependence; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758313
  • Filename
    4758313