DocumentCode
2453875
Title
An application of interleaved DC-DC converters to obtain I-V characteristic curves of photovoltaic modules
Author
Durán, E. ; Galán, J. ; Sidrach-de-Cardona, M. ; Segura, F.
Author_Institution
Dipt. de Ing. Electron., de Sist. Informaticos y Autom., Univ. of Huelva, Huelva
fYear
2008
fDate
10-13 Nov. 2008
Firstpage
2284
Lastpage
2289
Abstract
The basic operation of a solar cell, module or photovoltaic generator under different irradiation and temperature conditions is characterized by its I-V characteristic curve. Only the experimental measurement of the I-V curve allows us to know the electrical parameters of a photovoltaic cell, module or array. This measure provides very relevant information for the design, installation and maintenance of photovoltaic systems. Currently, the I-V characteristic curve is obtained by connecting a variable charge to the panel terminals in order to achieve that the current of the terminals ranges from zero to the short circuit current. In this paper, a new experimental methodology to measure this characteristic curve by using several SEPIC converters in parallel connection operating in interleaved mode is proposed. This methodology provides two fundamental advantages for this application as regards the use of a single converter: (1) It allows to reproduce I-V curves of higher power (2) It allows to obtain these curves with lower ripple.
Keywords
DC-DC power convertors; photovoltaic power systems; short-circuit currents; solar cells; I-V characteristic curves; SEPIC converters; electrical parameters; interleaved DC-DC converters; photovoltaic generator; photovoltaic modules; short circuit current; solar cell; DC-DC power converters; Electric variables measurement; Joining processes; Photovoltaic cells; Photovoltaic systems; Pollution measurement; Power generation; Solar power generation; Temperature dependence; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location
Orlando, FL
ISSN
1553-572X
Print_ISBN
978-1-4244-1767-4
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2008.4758313
Filename
4758313
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