DocumentCode :
2454293
Title :
Temperature dependence of the radiative recombination in GaN
Author :
Bergman, J.P. ; Monemar, B. ; Amano, H. ; Akasaki, I.
Author_Institution :
Dept. of Phys. & Meas. Technol., Linkoping Univ., Sweden
fYear :
1996
fDate :
29 Apr-3 May 1996
Firstpage :
93
Lastpage :
96
Abstract :
We have studied the radiative recombination from two different type of GaN samples using photoluminescence and time resolved photoluminescence, in the temperature range from 2 K to room temperature. The emission at low temperatures is dominated by the recombination of donor bound excitons, with decay time of about 250 ps. At temperatures from 40 K and up to room temperature the free exciton recombination is dominating. In the bulk sample we observe an increase of the measured decay time at temperatures up to 15 K, interpreted as the presence of a dominating radiative recombination for the free exciton. The decay time of the free exciton at higher temperatures is dominated by non-radiative recombination
Keywords :
III-V semiconductors; electron-hole recombination; excitons; gallium compounds; impurity states; photoluminescence; time resolved spectra; 2 to 300 K; GaN; decay time; donor bound excitons; free exciton decay time; nonradiative recombination; photoluminescence; radiative recombination; temperature dependence; time resolved photoluminescence; Excitons; Gallium nitride; Iron; Optical buffering; Photoluminescence; Photonic band gap; Radiative recombination; Substrates; Temperature dependence; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconducting and Semi-Insulating Materials Conference, 1996. IEEE
Conference_Location :
Toulouse
Print_ISBN :
0-7803-3179-6
Type :
conf
DOI :
10.1109/SIM.1996.570887
Filename :
570887
Link To Document :
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