DocumentCode :
2454420
Title :
On nanoscale integration and gigascale complexity in the post .com world
Author :
De Man, H.
Author_Institution :
KU Leuven
fYear :
2002
fDate :
4-8 March 2002
Firstpage :
12
Lastpage :
12
Abstract :
Summary form only given, as follows. While process technologists are obsessed to follow Moore´s curve down to nanoscale dimensions, design technologists are confronted with gigascale complexity. On the other hand, post-PC and post dotcom products require zero cost, zero energy yet software programmable novel system architectures to be sold in huge volumes and to be designed in exponentially decreasing time. How do we cope with these novel silicon architectures? What challenges in research does this create? How to create the necessary tools and skills and how to organize research and education in a world driven by shareholders value? Can you spare half an hour to reflect on these challenges to the design community?
Keywords :
Automatic testing; Computer architecture; Costs; Design automation; Educational programs; Electronics industry; Europe; Power generation economics; Silicon; Software systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris, France
ISSN :
1530-1591
Print_ISBN :
0-7695-1471-5
Type :
conf
DOI :
10.1109/DATE.2002.998239
Filename :
998239
Link To Document :
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