• DocumentCode
    2454472
  • Title

    Research of microstructure and characteristics of aging treatment of Cu-20Ni-5Sn alloy

  • Author

    Liu, Ruiqing ; Peng, Lijun ; Xiao, Xianpeng

  • Author_Institution
    Nat. Res. Center of Copper Metall. & Metal-working Eng. & Technol., Eng. Inst. of Jiangxi Univ. Technol. & Sci., Ganzhou, China
  • fYear
    2011
  • fDate
    24-26 June 2011
  • Firstpage
    3366
  • Lastpage
    3369
  • Abstract
    Study the effect of aging treatment on tensile strength, elongation and electrical conductivity of Cu-20Ni-5Sn alloy. Investigate the relationship between the second phases and microstructure of alloy which has good integrative feature. The results show that cold deformation is useful to obtain double strengthening effect of deformation and aging. The strength rises with the increase of aging temperature because the action of modulation resolution. The holding time which alloy achieves peak strength shortens with the increase of aging temperature. The electrical conductivity rises greatly with the increase of holding time when it is less than 2h, and enhances slightly when it is more than 2h. Aging treatment at 375°C×8h, alloy has good integrative feature, the tensile strength, elongation and electrical conductivity are 927MPa, 10%, 6.4IACS%respectively.
  • Keywords
    ageing; copper alloys; deformation; electrical conductivity; elongation; modulation; nickel alloys; tin alloys; CuNiSn; aging treatment; cold deformation; double strengthening effect; electrical conductivity; elongation; modulation resolution; tensile strength; Aging; Conductivity; Materials; Microstructure; Nickel; Tin; Cu-20Ni-5Sn alloy; aging temperature; electrical conducticity; holding time; microstructure; sgtrength and elongation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Remote Sensing, Environment and Transportation Engineering (RSETE), 2011 International Conference on
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-9172-8
  • Type

    conf

  • DOI
    10.1109/RSETE.2011.5965034
  • Filename
    5965034