DocumentCode :
2454776
Title :
Autonomous Clustering Characterization for Categorical Data
Author :
Grozavu, Nistor ; Labiod, Lazhar ; Bennani, Younès
Author_Institution :
LIPN, Univ. Paris 13, Villetaneuse, France
fYear :
2010
fDate :
12-14 Dec. 2010
Firstpage :
607
Lastpage :
613
Abstract :
This paper addresses the problem of cluster characterization by selecting a subset of the most relevant features for each cluster from a categorical dataset in an autonomous way. The proposed autonomous model is based on the Relational Topological Clustering (RTC) associated with a statistical test which allows to detect the most important variables in an automatic way without setting any parameters. The RTC approach is used to build a prototypes matrix which contains continuous variables, where each prototype vector represents correlated categorical data. Thereafter, the statistical ScreeTest is used to detect relevant and correlated features (or modalities) for each prototype. The proposed method requires simple computational techniques and the RTC topology technique is based on the principle of the self-organizing map (SOM) model. This method allows the dimensionality reduction, visualization and cluster characterization simultaneously. Empirical results based on real datasets from the UCI repository, are given and discussed.
Keywords :
category theory; data reduction; data visualisation; feature extraction; pattern clustering; self-organising feature maps; statistical testing; unsupervised learning; autonomous clustering characterization; categorical data; cluster characterization; dimensionality reduction; feature detection; prototype matrix; prototype vector; relational topological clustering; self-organizing map; statistical ScreeTest; statistical test; unsupervised learning; visualization; Acceleration; Algorithm design and analysis; Clustering algorithms; Eigenvalues and eigenfunctions; Machine learning; Neurons; Prototypes; autonomous learning; feature selection; relational clustering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Machine Learning and Applications (ICMLA), 2010 Ninth International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-9211-4
Type :
conf
DOI :
10.1109/ICMLA.2010.94
Filename :
5708893
Link To Document :
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