DocumentCode
2454888
Title
Millimeter wave imaging technologies
Author
Mizuno, Koji
Author_Institution
Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
fYear
1998
fDate
29 Sep-2 Oct 1998
Firstpage
289
Lastpage
290
Abstract
Imaging technologies using millimeter (MM) waves offer a unique means of measurement in many application areas. We discuss MM-wave focal plane imaging technologies whose resolution is limited by diffraction and also MM-wave scanning near-field microscopy whose resolution is much smaller than the operating wavelength. The author´s research on both of these are introduced and discussed
Keywords
Yagi antenna arrays; electromagnetic wave diffraction; focal planes; millimetre wave imaging; near-field scanning optical microscopy; plasma diagnostics; MM-wave focal plane imaging; Yagi antennas; diffraction; imaging array; measurement; millimeter wave imaging technologies; operating wavelength; plasma diagnostics; resolution; sampling theorem; scanning near-field microscopy; Image resolution; Microscopy; Millimeter wave communication; Millimeter wave measurements; Millimeter wave radar; Millimeter wave technology; Optical arrays; Optical imaging; Optical scattering; Optical signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Signals, Systems, and Electronics, 1998. ISSSE 98. 1998 URSI International Symposium on
Conference_Location
Pisa
Print_ISBN
0-7803-4900-8
Type
conf
DOI
10.1109/ISSSE.1998.738084
Filename
738084
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