DocumentCode :
2455191
Title :
Spatial Resolution of Thermal Wave Microscopes
Author :
Inglehart, L.J. ; Lin, M.J. ; Favro, L.D. ; Kuo, P.K. ; Thomas, R.L.
fYear :
1983
fDate :
Oct. 31 1983-Nov. 2 1983
Firstpage :
668
Lastpage :
671
Keywords :
Aluminum; Frequency; Microscopy; Optical beams; Optical surface waves; Photothermal effects; Physics; Spatial resolution; Surface cracks; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1983 Ultrasonics Symposium
Conference_Location :
Atlanta, GA, USA
Type :
conf
DOI :
10.1109/ULTSYM.1983.198141
Filename :
1535081
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2455191
