DocumentCode
2455214
Title
Embedded diagnosis IP
Author
Pateras, Stephen
Author_Institution
LogicVision, San Jose, CA, USA
fYear
2002
fDate
2002
Firstpage
242
Lastpage
243
Abstract
Today´s market conditions are driving increasingly shorter time to market requirements for semiconductor devices. Effective techniques for achieving quick and accurate debug and fault diagnosis of increasingly complex SOC devices are therefore becoming indispensable. This presentation covers new embedded test based IP and related software tools that provide the desired level of debug and diagnosis
Keywords
built-in self test; industrial property; integrated circuit design; integrated circuit testing; production testing; IP; SOC design; complex SOC devices; debugging; fault diagnosis; market requirements; semiconductor devices; software tools; Built-in self-test; Circuit testing; Control systems; Costs; Logic testing; Manufacturing; Random access memory; Signal generators; System-on-a-chip; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location
Paris
ISSN
1530-1591
Print_ISBN
0-7695-1471-5
Type
conf
DOI
10.1109/DATE.2002.998278
Filename
998278
Link To Document