Title :
Embedded diagnosis IP
Author :
Pateras, Stephen
Author_Institution :
LogicVision, San Jose, CA, USA
Abstract :
Today´s market conditions are driving increasingly shorter time to market requirements for semiconductor devices. Effective techniques for achieving quick and accurate debug and fault diagnosis of increasingly complex SOC devices are therefore becoming indispensable. This presentation covers new embedded test based IP and related software tools that provide the desired level of debug and diagnosis
Keywords :
built-in self test; industrial property; integrated circuit design; integrated circuit testing; production testing; IP; SOC design; complex SOC devices; debugging; fault diagnosis; market requirements; semiconductor devices; software tools; Built-in self-test; Circuit testing; Control systems; Costs; Logic testing; Manufacturing; Random access memory; Signal generators; System-on-a-chip; Time to market;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-1471-5
DOI :
10.1109/DATE.2002.998278
