• DocumentCode
    2455439
  • Title

    A mixed-signal design reuse methodology based on parametric behavioural models with non-ideal effects

  • Author

    Ginés, Antonio J. ; Peralias, Eduardo ; Rueda, Adoraciön ; Madrid, Natividad Martinez ; Seepold, Ralf

  • Author_Institution
    Centro Nacional de Microelectron., Instituto de Microelectron. de Sevilla, Spain
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    310
  • Lastpage
    314
  • Abstract
    Current system-on-chip (SoC) designs incorporate an increasing number of mixed-signal components. Design reuse techniques have proved successful for digital design but these rules are difficult to transfer to mixed-signal design. A top-down methodology is missing but the low level of abstraction in designs makes system integration and verification a very difficult, tedious and complex task. This paper presents a contribution to mixed-signal design reuse where a design methodology is proposed based on modular and parametric behavioural components. They support a design process where non-ideal effects can be incorporated in an incremental way, allowing easy architectural selection and accurate simulations. A working example is used through the paper to highlight and validate the applicability of the methodology
  • Keywords
    circuit CAD; circuit simulation; industrial property; integrated circuit design; mixed analogue-digital integrated circuits; SoC designs; architectural selection; design abstraction; design process; design reuse techniques; digital design; mixed-signal components; mixed-signal design reuse methodology; modular behavioural components; nonideal effects; parametric behavioural models; simulations; system integration; system verification; system-on-chip designs; top-down methodology; Acceleration; Design automation; Design methodology; Digital systems; Libraries; Microelectronics; Phase locked loops; Process design; Standardization; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1471-5
  • Type

    conf

  • DOI
    10.1109/DATE.2002.998290
  • Filename
    998290