Title :
Optimizing signal integrity, data throughput, and costs in mixed architecture systems
Abstract :
A test system design that is limited to a single hardware architecture, whether it is rack-and-stack or an open-standard modular platform like VXI, may have considerable appeal for reasons of consistency. However, there are often compromises in performance or price that can be avoided by mixing and matching the best of both worlds. This paper describes a systematic approach to making the best instrumentation choices using an example configuration designed for testing satellite power subsystem controllers.
Keywords :
aerospace control; aircraft power systems; automatic test equipment; controllers; electronic equipment testing; peripheral interfaces; space vehicle electronics; space vehicle power plants; VXI; automated test system; cost optimization; data throughput; instrumentation selection; mixed architecture test systems; open-standard modular platform; performance compromises; price compromises; rack-and-stack architecture; satellite power subsystem controller testing configuration; signal integrity; single hardware architecture; test system design; Automatic testing; Circuit testing; Cost function; Electronic equipment testing; Energy management; Instruments; Satellites; System testing; Throughput; Voltage;
Conference_Titel :
AUTOTESTCON Proceedings, 2002. IEEE
Print_ISBN :
0-7803-7441-X
DOI :
10.1109/AUTEST.2002.1047890
