• DocumentCode
    2455706
  • Title

    Prospects of bipolar power devices in silicon carbide

  • Author

    Agarwal, Anant ; Zhang, Qingehum Jon ; Burk, Al ; Callanan, Robert ; Mazumder, Sudip

  • Author_Institution
    Cree Inc., Research Triangle Park, NC
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    2879
  • Lastpage
    2884
  • Abstract
    There has been a rapid improvement in SiC materials and power devices during the last few years. SiC unipolar devices such as Schottky diodes, JFETS and MOSFETs have been developed extensively and advantages of insertion such devices in the power systems have been demonstrated. However, for high power systems such as high voltage converters, bipolar devices are preferable due to their low on-resistance. In this work, a detailed review of the current situation and future trends in SiC power switches, especially BJTs, IGBTs, and GTOs, is given with an emphasis on the device designs and characterization. On the contrary to Silicon BJTs, SiC BJTs exhibit a positive temperature coefficient for the on-state voltage drop, which makes SiC BJTs easily paralleled. In addition, a current gain of 50-70 has been routinely achieved on SiC BJTs which can significantly simplify the gate drive circuits. SiC IGBTs are suitable as the power switches in the range of 10 - 20 kV due to the conductivity modulation and simple gate driver. SiC GTOs have shown superior high current handling capabity even at high temperatures making the preferable device for high power pulse applications. This paper discusses the state-of-the-art achievements on these devices and identifies the key issues in SiC materials and device processing which will influence the future SiC power bipolar device commercialization.
  • Keywords
    bipolar transistor switches; insulated gate bipolar transistors; power bipolar transistors; power semiconductor devices; power supplies to apparatus; silicon compounds; thyristors; wide band gap semiconductors; BJT; GTO; IGBT; SiC; bipolar power device; conductivity modulation; device characterization; device designs; high power systems; power switch; voltage 10 kV to 20 kV; Circuits; Conductivity; Insulated gate bipolar transistors; JFETs; MOSFETs; Power systems; Schottky diodes; Silicon carbide; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758416
  • Filename
    4758416