DocumentCode :
2455706
Title :
Prospects of bipolar power devices in silicon carbide
Author :
Agarwal, Anant ; Zhang, Qingehum Jon ; Burk, Al ; Callanan, Robert ; Mazumder, Sudip
Author_Institution :
Cree Inc., Research Triangle Park, NC
fYear :
2008
fDate :
10-13 Nov. 2008
Firstpage :
2879
Lastpage :
2884
Abstract :
There has been a rapid improvement in SiC materials and power devices during the last few years. SiC unipolar devices such as Schottky diodes, JFETS and MOSFETs have been developed extensively and advantages of insertion such devices in the power systems have been demonstrated. However, for high power systems such as high voltage converters, bipolar devices are preferable due to their low on-resistance. In this work, a detailed review of the current situation and future trends in SiC power switches, especially BJTs, IGBTs, and GTOs, is given with an emphasis on the device designs and characterization. On the contrary to Silicon BJTs, SiC BJTs exhibit a positive temperature coefficient for the on-state voltage drop, which makes SiC BJTs easily paralleled. In addition, a current gain of 50-70 has been routinely achieved on SiC BJTs which can significantly simplify the gate drive circuits. SiC IGBTs are suitable as the power switches in the range of 10 - 20 kV due to the conductivity modulation and simple gate driver. SiC GTOs have shown superior high current handling capabity even at high temperatures making the preferable device for high power pulse applications. This paper discusses the state-of-the-art achievements on these devices and identifies the key issues in SiC materials and device processing which will influence the future SiC power bipolar device commercialization.
Keywords :
bipolar transistor switches; insulated gate bipolar transistors; power bipolar transistors; power semiconductor devices; power supplies to apparatus; silicon compounds; thyristors; wide band gap semiconductors; BJT; GTO; IGBT; SiC; bipolar power device; conductivity modulation; device characterization; device designs; high power systems; power switch; voltage 10 kV to 20 kV; Circuits; Conductivity; Insulated gate bipolar transistors; JFETs; MOSFETs; Power systems; Schottky diodes; Silicon carbide; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location :
Orlando, FL
ISSN :
1553-572X
Print_ISBN :
978-1-4244-1767-4
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2008.4758416
Filename :
4758416
Link To Document :
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