• DocumentCode
    2455735
  • Title

    An efficient compiler technique for code size reduction using reduced bit-width ISAs

  • Author

    Halambi, Ashok ; Shrivastava, Aviral ; Biswas, Partha ; Dutt, Nikil ; Nicolau, Alex

  • Author_Institution
    Dept. of Inf. & Comput. Sci., California Univ., Irvine, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    402
  • Lastpage
    408
  • Abstract
    For many embedded applications, program code size is a critical design factor. One promising approach for reducing code size is to employ a "dual instruction set", where processor architectures support a normal (usually 32 bit) Instruction Set, and a narrow, space-efficient (usually 16 bit) Instruction Set with a limited set of opcodes and access to a limited set of registers. This future, however, requires compilers that can reduce code size by compiling for both Instruction Sets. Existing compiler techniques operate at the function-level granularity and are unable to make the trade-off between increased register pressure (resulting in more spills) and decreased code size. We present a profitability based compiler heuristic that operates at the instruction-level granularity and is able to effectively take advantage: of both Instruction Sets. We also demonstrate improved code size reduction, for the MIPS 32/16 bit ISA, using our technique. Our approach more than doubles the code size reduction achieved by existing compilers
  • Keywords
    embedded systems; instruction sets; optimising compilers; parallelising compilers; reduced instruction set computing; 16 bit; 16 bit instruction set; 32 bit; 32 bit instruction set; MIPS 32/16 bit ISA; code size reduction; dual instruction set; embedded applications; instruction set architecture; instruction-level granularity; optimizing memory-aware instruction level parallelizing compiler; processor architectures; profitability based compiler; program code size; programmable RISC processors; reduced bit-width ISAs; Automatic testing; Design automation; Europe; Instruction sets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1471-5
  • Type

    conf

  • DOI
    10.1109/DATE.2002.998305
  • Filename
    998305