DocumentCode
2455866
Title
How to get 99% inverter efficiency
Author
Takahashi, Isao ; Itoh, Jun-Ichi ; Su, Guijia
Author_Institution
Dept. of Electr. Eng., Nagaoka Univ. of Technol., Niigata, Japan
fYear
1994
fDate
2-6 Oct 1994
Firstpage
971
Abstract
Base drive methods are proposed to realize high efficiency Darlington transistor inverters. High efficiency is achieved by reducing the on-state drop of the Darlington transistors to that of simple ones, thus significantly cutting the resultant on-state losses. Two practical drive circuits are presented. First, the circuit for directly driving the output transistor of a Darlington transistor is discussed and some experimental results are included when applied to a 100 kVA three-phase bridge inverter. In the second drive circuit, the on-state drop of a Darlington transistor is reduced by compensating the drop of the driver transistor with a current transformer; thus reducing the on-state losses while keeping the advantages of the Darlington transistor. A 10 kVA three-phase bridge inverter using Darlington transistors intended for electric vehicle applications was built to test the CT compensated base drive method. Typical experimental results are included, which showed high efficiency of 99.3% at a 10 kW resistive load. An energy recovery snubber for reducing the switching losses is also presented
Keywords
DC-AC power convertors; bipolar transistor switches; bridge circuits; compensation; current transformers; driver circuits; invertors; losses; power bipolar transistors; power semiconductor switches; snubbers; 10 kVA; 10 kW; 100 kVA; 99.3 percent; Darlington transistor inverters; current transformer; drive circuit; drive circuits; driver transistor; electric vehicle applications; energy recovery snubber; inverter efficiency; on-state drop reduction; on-state losses reduction; resistive load; switching losses reduction; three-phase bridge inverter; Bridge circuits; Current transformers; Driver circuits; Electric vehicles; Inverters; Motor drives; Snubbers; Switching loss; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 1994., Conference Record of the 1994 IEEE
Conference_Location
Denver, CO
Print_ISBN
0-7803-1993-1
Type
conf
DOI
10.1109/IAS.1994.377536
Filename
377536
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