• DocumentCode
    2455873
  • Title

    Analysis of noise avoidance techniques in DSM interconnects using a complete crosstalk noise model

  • Author

    Becer, Murat R. ; Blaauw, David ; Zolotov, Vladimir ; Panda, Rajendran ; Hajj, Ibrahim N.

  • Author_Institution
    Adv. Tools Group, Austin, TX, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    456
  • Lastpage
    463
  • Abstract
    Noise estimation and avoidance are becoming critical, ´must have´ capabilities in today´s high performance IC design. An accurate yet efficient crosstalk noise model which contains as many driver/interconnect parameters as possible, is necessary for any sensitivity based noise avoidance approach. In this paper, we present a complete analytical crosstalk noise model which incorporates all physical properties including victim and aggressor drivers, distributed RC characteristics of interconnects and coupling locations in both victim and aggressor lines. We present closed-form analytical expressions for peak noise and noise width as well as sensitivities to all model parameters. We then use them model parameter sensitivities to analyze and evaluate various noise avoidance techniques such as driver sizing, wire sizing, wire spacing and layer assignment. Both our model and noise avoidance evaluations are verified using realistic circuits in 0.13μ technology. We also present effectiveness of discussed noise avoidance techniques on a high performance microprocessor core
  • Keywords
    crosstalk; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; microprocessor chips; 0.13 micron; IC design; aggressor driver; coupling location; crosstalk noise model; deep-submicron interconnect; distributed RC characteristics; microprocessor; noise avoidance; victim driver; Capacitance; Circuit noise; Cost accounting; Coupling circuits; Crosstalk; Delay; Driver circuits; Integrated circuit interconnections; Integrated circuit noise; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1471-5
  • Type

    conf

  • DOI
    10.1109/DATE.2002.998313
  • Filename
    998313