• DocumentCode
    245592
  • Title

    A Novel Relative Frequency Based Ring Oscillator Physical Unclonable Function

  • Author

    Chaohui Du ; Guoqiang Bai

  • Author_Institution
    Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
  • fYear
    2014
  • fDate
    19-21 Dec. 2014
  • Firstpage
    569
  • Lastpage
    575
  • Abstract
    Silicon physical unclonable function (PUF) exploits the random variation in the manufacturing process to extract unique information for each chip. Ring oscillator PUF (RO-PUF) is easy to implement for both ASIC and FPGA, and it becomes one of the most popular techniques to build a PUF. However, the unwanted systematic process variation degrades the randomness and uniqueness of RO-PUF. To reduce the effect of the systematic process variation and improve the randomness and uniqueness of RO-PUF, we propose a novel relative frequency based RO-PUF which exploits the differences between relative frequencies instead of absolute frequencies to generate unique secrets. Our proposed RO-PUF is lightweight, and it does not need extra hardware resources compared with the conventional RO-PUF. Experimental results on 193 FPGAs showed that the proposed RO-PUF could improve the average fractional hamming weight of a n-bit response from 25.34% to 50.40% and the average inter-die fractional hamming distance from 31.40% to 46.83%. Moreover, we propose a post-processing scheme to improve the reliability of the enrolled challenge response pairs, and it could reduce the error rate of the relative frequency based RO-PUF from 17.05% to 5.73% in the worst case.
  • Keywords
    field programmable gate arrays; oscillators; reliability; ASIC; FPGA; average fractional hamming weight; average interdie fractional hamming distance; post-processing scheme; random variation; relative frequency based RO-PUF; ring oscillator PUF; silicon physical unclonable function; systematic process variation; Field programmable gate arrays; Hardware; Integrated circuit reliability; Random processes; Ring oscillators; Systematics; Manufacturing process variation; Physical unclonable function; Randomness; Relative frequency; Reliability; Ring oscillator; Systematic process variation; Uniqueness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Science and Engineering (CSE), 2014 IEEE 17th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4799-7980-6
  • Type

    conf

  • DOI
    10.1109/CSE.2014.129
  • Filename
    7023639