مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2455941

Title :

Session 11

fYear :

2009

fDate :

27-29 April 2009

Firstpage :

147

Lastpage :

147

Abstract :

Start of the above-titled section of the conference proceedings record.

Keywords :

Data mining; FinFETs; Flash memory; Nanoscale devices; Probability density function; Reliability; SONOS devices;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Technology, Systems, and Applications, 2009. VLSI-TSA '09. International Symposium on

Conference_Location :

Hsinchu

ISSN :

1524-766X

Print_ISBN :

978-1-4244-2784-0

Type :

conf

DOI :

10.1109/VTSA.2009.5159332

Filename :

5159332

Link To Document :