Session 11

fYear

2009

fDate

27-29 April 2009

Firstpage

147

Lastpage

147

Abstract

Start of the above-titled section of the conference proceedings record.

Keywords

Data mining; FinFETs; Flash memory; Nanoscale devices; Probability density function; Reliability; SONOS devices;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, Systems, and Applications, 2009. VLSI-TSA '09. International Symposium on

Conference_Location

Hsinchu

ISSN

1524-766X

Print_ISBN

978-1-4244-2784-0

Type

conf

DOI

10.1109/VTSA.2009.5159332

Filename

5159332

Link To Document