Non-invasive current measurement pulsed electron system and measurement techniques

This paper explains the theory, manufacture, and techniques for practical use of a non-invasive measurement sensor for electrical current in wires, cables, component leads, and traces in printed circuit boards. All current established technologies used for this purpose exhibit technical weaknesses, as well as the technical strengths for which they are chosen. Some technical weaknesses exhibited include low response to both AC and DC currents, high sensitivity to magnetic noise, difficulty in repeatability, and low effectiveness in areas densely populated with current carriers, e.g. PCBs. The proposed hardware sensor system measures the deflection of a pulsed stream of electrons generated from a low voltage electro-optical source. The concept of electron beam deflection is not innovative in itself, but is largely unexplored for the measurement of magnetic fields, specifically magnetic fields generated by current carriers. Therefore this sensor has the potential to exhibit strengths and weaknesses different from established technologies. The techniques for measurement procedures to be used in conjunction with analytical software to be included in a potential current sensing system has the probability of providing additional strengths to both the proposed pulsed electron sensor, and the sensors of established technologies.