Title :
High-frequency nonlinear amplifier model for the efficient evaluation of inband distortion under nonlinear load-pull conditions
Author :
Vandersteen, Gerd ; Verbeyst, Frans ; Wambacq, Piet ; Donnay, Stephane
Author_Institution :
IMEC, Heverlee, Belgium
Abstract :
Designing complex analog systems needs different abstraction levels to reduce the overall complexity. The required level of abstraction depends on the accuracy and the purpose of the model. High-frequency amplifier mode-Is can vary from simple transfer functions for efficient bit-error-rate analysis up to detailed transistor level descriptions for accurate load-pull prediction. This paper introduces a nonlinear black-box model for high-frequency amplifiers. It extends the linear S-parameter representation to enable both efficient system-level simulations and load-pull prediction. Both are demonstrated on the measurements of a high-frequency amplifier excited using a WLAN-OFDM modulation
Keywords :
S-parameters; UHF amplifiers; UHF integrated circuits; circuit simulation; electric distortion; integrated circuit modelling; transfer functions; wireless LAN; WLAN-OFDM modulation; abstraction levels; bit-error-rate analysis; high-frequency nonlinear amplifier model; inband distortion; linear S-parameter representation; nonlinear black-box model; nonlinear load-pull conditions; overall complexity; system-level simulations; transfer functions; transistor level descriptions; Feedback loop; Frequency dependence; Impedance; Neural networks; Nonlinear distortion; OFDM modulation; Predictive models; Scattering parameters; Transfer functions; Wireless LAN;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-1471-5
DOI :
10.1109/DATE.2002.998360