• DocumentCode
    2456309
  • Title

    A linear-centric modeling approach to harmonic balance analysis

  • Author

    Li, Peng ; Pileggi, Lawrence

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    634
  • Lastpage
    639
  • Abstract
    In this paper, we propose a new harmonic balance simulation methodology based on a linear-centric modeling approach. A linear circuit representation of the nonlinear devices and associated parasitics is used along with corresponding time and frequency domain inputs to solve for the nonlinear steady-state response via successive chord (SC) iterations. For our circuit examples, this approach is shown to be up to 60× more run-time efficient than traditional Newton-Raphson (N-R) based iterative methods, while providing the same level of accuracy. This SC-based approach converges as reliably as the N-R approaches, including for circuit problems which cause alternative relaxation-based harmonic balance approaches to fail. The efficacy of this linear-centric methodology further improves with increasing model complexity, the inclusion of interconnect parasitics and other analyses that are otherwise difficult with traditional nonlinear models
  • Keywords
    Newton-Raphson method; analogue integrated circuits; circuit complexity; circuit simulation; integrated circuit modelling; linearisation techniques; nonlinear network analysis; frequency domain inputs; harmonic balance simulation methodology; interconnect parasitics; linear circuit representation; linear-centric modeling; model complexity; nonlinear devices; nonlinear steady-state response; parasitics; reliable convergence; successive chord iterations; time domain inputs; Circuit simulation; Convergence; Ear; Frequency; Harmonic analysis; Iterative methods; Nonlinear circuits; Nonlinear equations; Runtime; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1471-5
  • Type

    conf

  • DOI
    10.1109/DATE.2002.998367
  • Filename
    998367