Title :
Congestion-aware logic synthesis
Author :
Pandini, Davide ; Pileggi, Lawrence T. ; Strojwas, Andrzej J.
Author_Institution :
Central R&D, STMicroelectronics, Agrate Brianza, Italy
Abstract :
In this era of Deep Sub-Micron (DSM) technologies, the impact of interconnects is becoming increasingly important as it relates to integrated circuit (IC) functionality and performance. In the traditional top-down IC design flow, interconnect effects are first taken into account during logic synthesis by way of wireload models. However, for technologies of 0.25 μm and below, the wiring capacitance dominates the gate capacitance and the delay estimation based on fanout and design legacy statistics can be highly inaccurate. In addition, logic block size is no longer dictated solely by total cell area, and is often limited by wiring area resources. For these reasons, wiring congestion is an extremely important design factor, and should be taken into consideration at the earliest possible stages of the design flow. In this paper we propose a novel methodology to incorporate congestion minimization within logic synthesis, and present results for industrial circuits that validate our approach
Keywords :
VLSI; circuit CAD; delay estimation; integrated circuit design; logic partitioning; minimisation; 0.25 μm; 0.25 micron; IC functionality; VLSI; capacitance; congestion minimization; delay estimation; industrial circuits; interconnects; logic synthesis; top-down IC design; wireload models; wiring congestion; Capacitance; Delay estimation; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit synthesis; Integrated circuit technology; Logic design; Minimization; Statistics; Wiring;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-1471-5
DOI :
10.1109/DATE.2002.998370