Title :
Inhomogeneities and coercivity of soft permalloy thin films
Author :
Yuan, S.W. ; Bertram, H.N.
Author_Institution :
University of California
Keywords :
Anisotropic magnetoresistance; Coercive force; Convergence; Enterprise resource planning; Equations; Fluctuations; Grain size; Pain; Potential well; Transistors;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696518
