• DocumentCode
    2456490
  • Title

    Incremental diagnosis and correction of multiple faults and errors

  • Author

    Veneris, Andreas ; Liu, J. Brandon ; Amiri, Mandana ; Abadir, Magdy S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    716
  • Lastpage
    721
  • Abstract
    An incremental simulation-based approach to fault diagnosis and logic debugging is presented. During each iteration of the algorithm, a single suspicious location is identified and fault modeled such that the functionality of the new design becomes "closer" to its specification. The method is based on a simple and, at a first glance, counter-intuitive theoretical result along with a number of heuristics which help avoid the exponential complexity inherent to the problems. Experiments on multiple design errors and multiple stuck-at faults confirm its effectiveness and accuracy, which scales well with increasing number of errors
  • Keywords
    circuit simulation; combinational circuits; error correction; fault diagnosis; logic simulation; sequential circuits; exponential complexity; functionality; heuristics; incremental diagnosis; incremental simulation-based approach; logic debugging; multiple design errors; multiple errors; multiple faults; stuck-at-faults; suspicious location; Algorithm design and analysis; Chip scale packaging; Circuit faults; Context modeling; Debugging; Error correction; Failure analysis; Fault diagnosis; Logic; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1471-5
  • Type

    conf

  • DOI
    10.1109/DATE.2002.998378
  • Filename
    998378