DocumentCode :
2456545
Title :
Functional verification for SystemC descriptions using constraint solving
Author :
Ferrandi, Fabrizio ; Rendine, Michele ; Sciuto, Donatella
Author_Institution :
Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
fYear :
2002
fDate :
2002
Firstpage :
744
Lastpage :
751
Abstract :
This paper addresses the problem of test vectors generation starting from an high level description of the system under test, specified in SystemC. The verification method considered is based upon the simulation of input sequences. The system model adopted is the classical Finite State Machine model. Then, according to different strategies, a set of sequences can be obtained, where a sequence is an ordered set of transitions. For each of these sequences, a set of constraints is extracted. Test sequences can be obtained by generating and solving the constraints, by using a constraint solver (GProlog). A solution of the constraint solver yields the values, of the input signals for which a sequence of transitions in the FSM is executed. If the constraints cannot be solved, it implies that the corresponding sequence cannot be executed by any test. The presented algorithm is not based on a specific fault model, but aims at reaching the highest possible path coverage
Keywords :
automatic test pattern generation; binary sequences; circuit simulation; constraint handling; finite state machines; formal specification; formal verification; hardware description languages; ATPG; FSM system model; GProlog; SystemC descriptions; constraint solving; finite state machine model; functional verification; high level description; input sequences simulation; path coverage; test sequences; test vectors generation; Automata; Automatic test pattern generation; Automatic testing; Computational modeling; Data structures; Electronic switching systems; Genetic algorithms; Hardware design languages; System testing; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris
ISSN :
1530-1591
Print_ISBN :
0-7695-1471-5
Type :
conf
DOI :
10.1109/DATE.2002.998382
Filename :
998382
Link To Document :
بازگشت