Title :
Using device ATE testers to solve system anomalies
Abstract :
This is a report of an electronic anomaly that occurred on an EEPROM that was operating in a laboratory mockup where there was limited control of timing and voltage levels. The electronic signals to the EEPROM were recreated on automatic test equipment where the symptoms of the anomaly were duplicated. Additional tests were done to solve the anomaly. The anomaly was caused by interrupt driven computer software that was writing to the part using out of specification timing.
Keywords :
EPROM; automatic test equipment; fault diagnosis; integrated circuit testing; timing; EEPROM; device ATE testers; fault diagnosis; interrupt driven computer software; laboratory mockup; memory test; out of specification timing; system anomalies; voltage levels; Aerospace engineering; Aerospace testing; Automatic test equipment; Circuit testing; EPROM; Integrated circuit testing; Laboratories; Software testing; System testing; Timing;
Conference_Titel :
AUTOTESTCON Proceedings, 2002. IEEE
Print_ISBN :
0-7803-7441-X
DOI :
10.1109/AUTEST.2002.1047947
