Title :
Numeric issues in test software correctness
Author :
Hayes, Robert G. ; Hughes, Gary B. ; Dorin, Phillip M. ; Toal, Raymond J.
Abstract :
Test system designers are comfortable with the concepts of precision and accuracy with regard to measurements achieved with modern instrumentation. In a well-designed test system, great care is taken to ensure accurate measurements, with rigorous attention to instrument specifications and calibration. However, measurement values are subjected to representation and manipulation as limited precision floating-point numbers by test software. This paper investigates some of the issues related to floating point representation of measurement values, as well as the consequences of algorithm selection. To illustrate, we consider the test case of standard deviation calculations as used in the testing of infrared focal plane arrays. We consider the concept of using statistically-based techniques for selection of an appropriate algorithm based on measurement values, and offer guidelines for the proper expression and manipulation of measurement values within popular test software programming frameworks.
Keywords :
Monte Carlo methods; automatic test equipment; automatic test software; calibration; floating point arithmetic; focal planes; infrared detectors; statistical analysis; Monte Carlo techniques; floating point representation; floating-point representation; infrared focal plane array testing; instrument calibration; instrument specifications; instrumentation; limited precision floating-point numbers; measurement accuracy; measurement precision; measurement value manipulation; measurement value representation; numeric issues; standard deviation calculations; statistically based algorithm selection; test software correctness; test software programming frameworks; test system design; Extraterrestrial measurements; Floating-point arithmetic; Instruments; Measurement standards; Monte Carlo methods; Software measurement; Software standards; Software testing; System testing; Vehicle crash testing;
Conference_Titel :
AUTOTESTCON Proceedings, 2002. IEEE
Print_ISBN :
0-7803-7441-X
DOI :
10.1109/AUTEST.2002.1047948