• DocumentCode
    2456660
  • Title

    A Self-Configuring Schema Matching System

  • Author

    Peukert, Eric ; Eberius, Julian ; Rahm, Erhard

  • Author_Institution
    SAP Res., Dresden, Germany
  • fYear
    2012
  • fDate
    1-5 April 2012
  • Firstpage
    306
  • Lastpage
    317
  • Abstract
    Mapping complex metadata structures is crucial in a number of domains such as data integration, ontology alignment or model management. To speed up the generation of such mappings, automatic matching systems were developed to compute mapping suggestions that can be corrected by a user. However, constructing and tuning match strategies still requires a high manual effort by matching experts as well as correct mappings to evaluate generated mappings. We therefore propose a self-configuring schema matching system that is able to automatically adapt to the given mapping problem at hand. Our approach is based on analyzing the input schemas as well as intermediate matching results. A variety of matching rules use the analysis results to automatically construct and adapt an underlying matching process for a given match task. We comprehensively evaluate our approach on different mapping problems from the schema, ontology and model management domains. The evaluation shows that our system is able to robustly return good quality mappings across different mapping problems and domains.
  • Keywords
    data integration; data structures; meta data; ontologies (artificial intelligence); pattern matching; automatic matching system; complex metadata structure mapping; data integration; generated mapping evaluation; mapping generation; model management domain; ontology alignment; self-configuring schema matching system; Adaptive systems; Libraries; Noise; Ontologies; Pattern matching; Robustness; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Engineering (ICDE), 2012 IEEE 28th International Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    1063-6382
  • Print_ISBN
    978-1-4673-0042-1
  • Type

    conf

  • DOI
    10.1109/ICDE.2012.21
  • Filename
    6228093