DocumentCode :
2456767
Title :
Low-power clock distribution networks for 3-D ICs
Author :
Rahimian, Somayyeh ; De Micheli, Giovanni ; Pavlidis, Vasilis F.
Author_Institution :
Integrated Syst. Lab., EPFL, Lausanne, Switzerland
fYear :
2012
fDate :
14-17 Nov. 2012
Firstpage :
1
Lastpage :
5
Abstract :
Designing a low power clock network in synchronous circuits is an important task. This requirement is stricter for 3-D circuits due to the increased power densities. Resonant clock networks are considered efficient low-power alternatives to conventional clock distribution schemes. These networks utilize additional inductive circuits to reduce the power consumption while delivering a full swing clock signal to the sink nodes. Test is another complex task for 3-D ICs, where pre-bond test is a prerequisite. This paper, consequently, introduces a design methodology for resonant 3-D clock networks that lowers the power of the clock networks while supporting pre-bond test. Several 3-D clock network topologies are explored in a 0.18 μm CMOS technology. Simulation results indicate 43% reduction in the power consumed by the resonant 3-D clock network as compared to a conventional buffered clock network. By properly distributing the inductance within the layers of the 3-D stack, resonance is ensured both in pre-bond test and normal operation. The important aspects of this approach are introduced in this paper.
Keywords :
CMOS digital integrated circuits; clock distribution networks; inductance; integrated circuit testing; three-dimensional integrated circuits; 3D IC; 3D stack; CMOS technology; additional inductive circuits; full swing clock signal; inductance distribution; low-power alternatives; low-power clock distribution networks; power consumption; power densities; prebond test; resonant 3D clock network topology; resonant clock networks; sink nodes; synchronous circuits; Capacitance; Clocks; Inductance; Network topology; RLC circuits; Through-silicon vias; Topology; 3-D integration; clock distribution network; inductive link; resonant clocking; wireless testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical & Electronics Engineers in Israel (IEEEI), 2012 IEEE 27th Convention of
Conference_Location :
Eilat
Print_ISBN :
978-1-4673-4682-5
Type :
conf
DOI :
10.1109/EEEI.2012.6377030
Filename :
6377030
Link To Document :
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