DocumentCode :
245677
Title :
Rényi´s Entropy Based Method for Analog Circuits Soft Fault Detection
Author :
Xuan Xie ; Xifeng Li ; Dongjie Bi ; Qizhong Zhou ; Yongle Xie ; Sanshan Xie
Author_Institution :
Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear :
2014
fDate :
19-21 Dec. 2014
Firstpage :
825
Lastpage :
830
Abstract :
We propose a Rényi´s entropy based analog circuit soft fault detection method. This method extracts the entropy information from the probability density function (PDF) of the output of the circuit under test (CUT), which is sensitive to the parameters of circuits. In this method, firstly, the Lagrange multiplier method with Rényi´s entropy is used to deduce PDF of the output signal. Then through the maximum likelihood estimation method, we estimate the parameter α of Rényi´s entropy adaptively according to the output of CUT. Finally, the value of Rényi´s entropy can be calculated using the PDF and α parameter. The divergence between the Rényi´s entropy corresponding to the fault and fault free circuits is adopted to detect the fault. This method can 100% detect soft faults, including the single fault and multiple faults, without complicate models and mass of data, and also with no need of interrupting the inherent contentions of CUT. Experiments are conducted respectively on two circuits that are implemented on an actual circuit board. The effectiveness of the proposed method is demonstrated by the result of the experiment.
Keywords :
analogue circuits; entropy; fault diagnosis; maximum likelihood estimation; probability; radiation hardening (electronics); CUT; Lagrange multiplier method; PDF; Rényi´s entropy based analog circuit soft fault detection method; circuit under test; entropy information; maximum likelihood estimation method; multiple faults; probability density function; single fault; Analog circuits; Band-pass filters; Circuit faults; Entropy; Estimation; Fault detection; Fault diagnosis; Lagrange multiplier method; Rényi´s entropy; analog circuit; component tolerance; soft fault;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Science and Engineering (CSE), 2014 IEEE 17th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-7980-6
Type :
conf
DOI :
10.1109/CSE.2014.168
Filename :
7023678
Link To Document :
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