• DocumentCode
    2457170
  • Title

    Mathematical modelling of powder paint particle trajectories in electrostatic painting

  • Author

    Ali, F.S. ; Base, T.E. ; Inculet, I.I.

  • Author_Institution
    Appl. Electrostat. Res. Centre, Univ. of Western Ontario, London, Ont., Canada
  • fYear
    1994
  • fDate
    2-6 Oct 1994
  • Firstpage
    1432
  • Abstract
    The trajectories of charged powder particles in an electrostatic powder coating system were modelled considering electrical and fluid forces. The mathematical model employed an iterative technique wherein the charge simulation method was used to compute the electric field strength and the method of characteristics was used to compute the charge density in the gun-to-target region. The fluid flow between the electrostatic gun and the target was modelled using interpolated experimental data assuming stagnation point flow. Particle trajectories were simulated for size range 10-40 μm and charge-to-mass ratios of 0.1-1 (-)μC/gram. The simulation results showed good agreement with experimental data (charge and mass measurements) at several collection points on the painting target and provided valuable information concerning particle deposition
  • Keywords
    electric charge; electric fields; electric strength; electrostatics; iterative methods; powder technology; spray coating techniques; 10 to 40 mum; charge density; charge measurements; charge simulation method; electric field strength; electrical forces; electrostatic painting; electrostatic powder coating system; fluid flow; fluid forces; gun-to-target region; iterative technique; mass measurements; mathematical modelling; painting target; particle deposition; powder paint particle trajectories; stagnation point flow; Charge measurement; Coatings; Computational modeling; Current measurement; Electrostatic measurements; Fluid flow; Iterative methods; Mathematical model; Paints; Powders;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 1994., Conference Record of the 1994 IEEE
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-1993-1
  • Type

    conf

  • DOI
    10.1109/IAS.1994.377612
  • Filename
    377612