Title :
Error event analysis of EPR4 and E2PR4 channels: captured head signals vs. Lorentzian signal models
Author :
Xu, C. ; Keim, Z.
Author_Institution :
Texas Instruments, Inc.
Keywords :
Bit error rate; Detectors; Error analysis; Event detection; Jitter; Magnetic heads; Moon; Signal analysis; Signal to noise ratio;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.871818
